蘇打掩模版(Soda Mask)使用蘇打玻璃作為基板材料,蘇打玻璃熱膨脹率相對高于石英玻璃,平整度和耐磨性相對弱于石英玻璃,成本相對較低,通常應用于中低精度掩模版。蘇打掩模版主要在精度要求較低的領域中使用,包括中低端半導體制造、半導體封裝、光學器件、中低端顯示面板、觸控屏和電路板制造等領域。
ITEM | Rank | S | Y | A | B | C | D | E | F | G | H | I |
---|---|---|---|---|---|---|---|---|---|---|---|---|
Design Rule | (μm) | >5 | 2-5 | 1-2 | 1 | 0.8 | 0.5 | 0.35 | 0.25 | 0.18 | 0.15 | 0.13 |
CD Tolerance | (±μm) | ±0.5 | ±0.3 | ±0.2 | ±0.15 | ±0.1 | ±0.075 | ±0.05 | ±0.04 | ±0.03 | ±0.025 | ±0.02 |
CD Range | (μm) | ≤0.5 | ≤0.3 | ≤0.2 | ≤0.15 | ≤0.1 | ≤0.07 | ≤0.05 | ≤0.04 | ≤0.035 | ≤0.03 | ≤0.025 |
CD mean to target | (μm) | ±0.5 | ±0.3 | ±0.2 | ±0.15 | ±0.1 | ±0.07 | ±0.04 | ±0.03 | ≤0.03 | ±0.02 | ±0.02 |
Registration & Overlay | Based on the 1st layer(μm) | ±0.5 | ±0.3 | ±0.2 | ±0.15 | ±0.12 | ±0.10 | ±0.07 | ±0.05 | ≤0.04 | ±0.03 | ±0.02 |
Defect | Defect size(μm) | <4 | <2 | <1.0 | <1.0 | <0.75 | <0.5 | <0.4 | <0.3 | <0.3 | <0.25 | <0.20 |